experimental data for 9ML
Experimental Data 5ML
X-axis
X-axis
Y-axis
X-axis
Y-axis
InterInter
J over J (T=0)
Experimental data 4ML
dash lineshows the spacer effect for the 4 ml sample
n subscript See u = 4 ML
n subscript Cu = 5 ML
n subscript See u = 9 ML
20000600040008000
0.2
0.4
0.6
0.8
1.0
Cu
AFM
Cu
FM
Cu
AFM
3/23/2
Figure 1Caption: Temperature dependence of J inter
normalized to J inter ( T = 0 ) for the trilayer IEC system Nickel 7 /
Copper n / Cobalt 2 / Copper ( 001 ) for three different spacer thicknesses n
Copper [21]. The data for 9 ML (solid squares) are taken from Ref. [5]. The dashed line corresponds solely to a spacer effect contribution for the
n Copper = 4 ML sample.
-
T super 3/2 [K super 3/2]
J sub inter / J sub inter (T=0)
N sub Cu = 4 ML
N sub Cu = 5 ML
N sub Cu = 9 ML